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Application Case | Heyiyi LC-S Series CMOS Laser Displacement Sensors in the New Energy Industry
Release time:2026-01-04
This case introduces Heyiyi LC-S Series CMOS laser displacement sensors, which feature high precision, multiple outputs and strong adaptability. Applied in lithium battery and photovoltaic sectors, they realize non-contact, accurate measurements of pole piece coating/thickness, battery swelling and silicon wafer flatness, ensuring product quality and production efficiency.
- Is the pole piece coating uniform?
- Is the battery swollen?
- Is the silicon wafer surface flat?
Core Product Advantages
Compact Size, Small Light Spot & High Precision
Multiple Output Modes for Flexible System Integration
Versatile Detection Ranges
Strong Adaptability
Application Scenarios
Lithium Battery Industry: The First Line of Defense for Battery Quality
- Coating Thickness Measurement of Lithium Battery Pole Pieces: Coating thickness directly affects battery capacity, safety and cycle life. The micron-level precision of LC-S Series enables real-time thickness monitoring, ensuring uniform coating of each pole piece and avoiding performance issues caused by thickness deviations.
- Lithium Battery Swelling Detection: Swelling is a potential safety hazard during battery production or use. The sensors can accurately detect shape changes of battery cells, identify swelling in a timely manner and prevent defective products from entering subsequent processes.
- Thickness Measurement of Lithium Battery Pole Pieces: Stable pole piece thickness is key to battery consistency. The non-contact measurement method avoids damaging pole pieces while ensuring accurate thickness data collection, laying a solid foundation for stable battery performance.
Photovoltaic Industry: Precise Control for Silicon Wafer Processing
- Flatness Detection of Photovoltaic Silicon Wafers: Silicon wafer flatness directly impacts the photoelectric conversion efficiency of photovoltaic modules. The LC-S Series can comprehensively detect surface flatness, screen out unqualified wafers promptly and reduce resource waste in subsequent processing.
- Stacking Height Control of Silicon Wafers: Precise stacking height control is critical during silicon wafer storage and processing. The sensors provide real-time height monitoring, preventing wafer damage due to over-stacking and improving production safety and efficiency.
CMOS Laser Displacement Sensors,New Energy Industry,High-precision Measurement,Non-contact Detection
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